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High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map

High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map
  • Mã tin: 4500
  • Ngày đăng: 10/02/2023
  • Gian hàng: mangyte  
  • Khu vực: Hà nội
  • Giá: Liên hệ
Yield-related traits including thousand grain weight (TGW), grain number per spike (GNS), grain width (GW), grain length (GL), plant height (PH), spike length (SL), and spikelet number per spike (SNS) are greatly associated with grain yield of wheat (Triticum aestivum L.).
Mạng Y Tế
Nguồn: https://tailieu.vn/doc/high-resolution-detection-of-quantitative-trait-loci-for-seven-important-yield-related-traits-in-whe-2613598.html
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